If you are looking for high-quality products, please feel free to contact us and send an inquiry, email: firstname.lastname@example.org
The 2022 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will bring scientists and engineers together interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, integration, and manufacturing. It will highlight major issues and provide critical reviews of important semiconductor techniques as the industry moves to silicon nanoelectronics and beyond. This conference will include both in-situ and nearline characterization and metrology methods.
Excillum’s Dr Bjorn Hansson will speak on “Fast and High-resolution Micro-XCT and Nano-XCT Imaging of Advanced Packaging Structures Using New X-ray Sources” at the FCMN conference. He will describe a new system for real-time micro-CT and nano-CT of high-resolution, thin-film Si:GaAs wafers with the ALPro-50 Differential Hall Effect Metrology (DHEM) profiler. This system enables direct activation profiles to be measured with a resolution down to 2nm through the wafer. These profiles correlate well with the chemical compositional profile obtained by SIMS.
Join over 1,000 elected officials and partners from across the country at the National Conference & Trade Show in Toronto. AC 2023 will help you foster connections with your peers, colleagues and federal representatives and help you make local action translate into national results.
The event will be anchored by Habiba Balogun, organisational development consultant and formally opened by Governor Babjide Sanwo-Olu of Lagos state. This year, the organisers are set to take the conference to another level with an unprecedented list of speakers from all sectors and industries. All ticket proceeds will be donated to Chess Includ, a non-profit that uses chess as a tool to empower and uplift the less privileged.